{"id":3220,"date":"2020-09-11T07:03:33","date_gmt":"2020-09-11T07:03:33","guid":{"rendered":"https:\/\/longchangchemical.com\/?p=3220"},"modified":"2026-04-28T10:41:46","modified_gmt":"2026-04-28T10:41:46","slug":"analytical-instruments-1","status":"publish","type":"post","link":"https:\/\/longchangchemical.com\/tr\/analytical-instruments-1\/","title":{"rendered":"Longchang Kimya Laboratuvar\u0131 taraf\u0131ndan sat\u0131n al\u0131nan Analitik Cihazlar\uff081\uff09"},"content":{"rendered":"

1. ICP<\/h4>\n\n\n

Quick answer:<\/strong> For general industrial-chemical topics, the safest commercial decision usually comes from checking application fit, specification, process compatibility, and handling requirements together instead of relying on one simplified rule.<\/p>\n\n\n\n\n\n\n\n

\"\"<\/figure>\n\n\n\n
\u0130ngilizce ad\u0131: Inductively Coupled Plasma-Atomic Emission Spectrometer
Model: Prodigy 7
\u00dcretici firma: Leeman \u015eirketi
K\u00f6ken: Birle\u015fik Devletler<\/h6>\n\n\n\n
Teknik g\u00f6stergeler: Optik \u00e7\u00f6z\u00fcn\u00fcrl\u00fck: \u22640.007nm (200 nm'de); Kararl\u0131l\u0131k: \u22641.0%; Tekrarlanabilirlik \u22641.0%;<\/h6>\n\n\n\n
Tespit limiti: \u03bcg\/L~\u03bcg\/mL Dalga boyu aral\u0131\u011f\u0131: 165nm-1100nm; Cihaz tipi: tam spektrum do\u011frudan okuma; Dedekt\u00f6r: CMOS kat\u0131 hal dedekt\u00f6r\u00fc.<\/h6>\n\n\n\n
\u0130\u015flev: Periyodik tablodaki 68 elementin kalitatif ve kantitatif analizini yapar. Kantitatif analiz, 0,01-100 \u03bcg\/mL (ppm) konsantrasyon aral\u0131\u011f\u0131ndaki numuneleri 0,01 ppm'ye kadar do\u011frulukla analiz edebilir ve ayn\u0131 anda bir numune enjeksiyonu ger\u00e7ekle\u015ftirebilir Numunedeki birden fazla element tespit edilir.<\/h6>\n\n\n\n
Prensip: Numune \u00e7\u00f6zeltisi buharla\u015f\u0131p gazla\u015ft\u0131ktan sonra, elementlerin t\u00fcm\u00fc gaz atomlar\u0131 \u015feklinde bulunur. Plazma uyar\u0131m\u0131 alt\u0131nda, gaz halindeki atomlar uyar\u0131lm\u0131\u015f durumdan temel duruma d\u00f6nerek radyasyon \u00fcretir. Farkl\u0131 elementlerin enerji seviyeleri farkl\u0131 oldu\u011fundan, kendi karakteristik radyasyon \u00e7izgilerine sahiptirler, ICP Cihaz, kalitatif ve kantitatif analiz yapmak i\u00e7in elementin t\u00fcr\u00fcn\u00fc ve konsantrasyonunu belirlemek i\u00e7in spektrumdaki her \u00e7izginin dalga boyunu ve yo\u011funlu\u011funu \u00f6l\u00e7er.<\/h6>\n\n\n\n

2. XRD<\/h4>\n\n\n\n
\"\"<\/figure>\n\n\n\n
\u0130ngilizce ad\u0131: X-Ray Powder Diffractometer
Model D2 FAZER
\u00dcretici firma: Bruker
K\u00f6ken: Almanya<\/h6>\n\n\n\n
Teknik g\u00f6stergeler: Theta \/ Theta dikey gonyometre;
2Teta a\u00e7\u0131s\u0131 aral\u0131\u011f\u0131: -3~160\u00b0;
Minimum ad\u0131m a\u00e7\u0131s\u0131 0,002'dir;
I\u015f\u0131\u011fa gerek yok; Cr\/Co\/Cu hedef, standart boyutta \u0131\u015f\u0131k t\u00fcp\u00fc;
Harici bir bilgisayara gerek yok, cihaz kontrol\u00fc ve veri toplama sisteminin entegre tasar\u0131m\u0131;
Harici su so\u011futmas\u0131 gerekmez;
\u00d6n kalibrasyon gerekmez;
Jenerat\u00f6r g\u00fcc\u00fc 300W, g\u00fc\u00e7 kayna\u011f\u0131 voltaj\u0131 90-250V, 50-60Hz, tak ve \u00e7al\u0131\u015ft\u0131r.<\/h6>\n\n\n\n
Fonksiyon: K\u0131r\u0131n\u0131m pikinin konumuna ve yar\u0131 y\u00fckseklik geni\u015fli\u011fine g\u00f6re tozun kristal yap\u0131s\u0131n\u0131 ve tane boyutunu belirlemek i\u00e7in k\u0131r\u0131n\u0131m prensibini kullan\u0131n. Standart kart k\u00fct\u00fcphanesi ile kar\u015f\u0131la\u015ft\u0131r\u0131larak, bilinmeyen numunenin yap\u0131s\u0131 ve bile\u015fimi \u00e7\u0131kar\u0131labilir ve faz analizi do\u011fru bir \u015fekilde ger\u00e7ekle\u015ftirilebilir. Kalitatif analiz, kantitatif analiz.<\/h6>\n\n\n\n
Prensip: Kristal malzemeler i\u00e7in, \u00f6l\u00e7\u00fclecek kristal gelen X-\u0131\u015f\u0131n\u0131na farkl\u0131 bir a\u00e7\u0131da oldu\u011funda, Bragg k\u0131r\u0131n\u0131m\u0131n\u0131 kar\u015f\u0131layan kristal d\u00fczlemi tespit edilecektir. XRD spektrumunda farkl\u0131 k\u0131r\u0131n\u0131m yo\u011funluklar\u0131na sahip k\u0131r\u0131n\u0131m pikleri olarak yans\u0131t\u0131l\u0131r. \u00d6l\u00e7\u00fclen k\u0131r\u0131n\u0131m piklerine g\u00f6re kristallerin yap\u0131s\u0131 hakk\u0131nda \u00e7\u0131kar\u0131m yapmak i\u00e7in kullan\u0131labilir. Ayn\u0131 zamanda, farkl\u0131 elementlerden olu\u015fan kristallerin kristal d\u00fczlemleri aras\u0131ndaki farktan dolay\u0131 k\u0131r\u0131n\u0131m piklerinin konumlar\u0131 da farkl\u0131d\u0131r. E\u015fle\u015fen elementlerin alg\u0131lama ara\u00e7lar\u0131 bilinen kristallerle kar\u015f\u0131la\u015ft\u0131r\u0131labilir. Amorf malzemeler i\u00e7in, kristal yap\u0131da uzun menzilli d\u00fczen olmad\u0131\u011f\u0131ndan, ancak birka\u00e7 atomda k\u0131sa menzilli d\u00fczen oldu\u011fundan, XRD deseni baz\u0131 da\u011f\u0131n\u0131k sa\u00e7\u0131lma pikleri g\u00f6sterir.<\/h6>\n\n\n\n

3. SEM+EDX<\/h4>\n\n\n\n
\"\"<\/figure>\n\n\n\n
\u0130ngilizce ad\u0131: Electron Microscope
Model Pro X
\u00dcretici firma: PHENOM
K\u00f6ken: Hollanda<\/h6>\n\n\n\n
Teknik g\u00f6stergeler: Optik mikroskop: 20-135 kat b\u00fcy\u00fctme; Elektron mikroskobu: 150.000 kez; Dedekt\u00f6r: Y\u00fcksek hassasiyetli d\u00f6rt b\u00f6l\u00fcml\u00fc geri sa\u00e7\u0131lan elektron dedekt\u00f6r\u00fc; Filament malzemesi: 1.500 saat CeB6 filament; Geri sa\u00e7\u0131lan elektron g\u00f6r\u00fcnt\u00fc \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc 8nm (10 kV), \u0130kincil elektron g\u00f6r\u00fcnt\u00fc \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc 8nm (10 kV); h\u0131zlanma voltaj\u0131: 5 kV-15 kV s\u00fcrekli ayarlanabilir; vakum s\u00fcresi: 15 saniyeden az; alg\u0131lama eleman\u0131 aral\u0131\u011f\u0131: B (5)-Am (95) elemanlar\u0131; Enerji spektrum dedekt\u00f6r\u00fc: silikon s\u00fcr\u00fcklenme dedekt\u00f6r\u00fc (SDD); so\u011futma y\u00f6ntemi: s\u0131v\u0131 nitrojen yok Peltier etkili elektrikli so\u011futma; enerji \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc: <123 eV (Mn Ka\u03b1); dedekt\u00f6r kristal aktif alan\u0131: 25 mm2<\/h6>\n\n\n\n
\u0130\u015flev: Alt\u0131n p\u00fcsk\u00fcrtmeden, numunenin y\u00fczey yap\u0131s\u0131n\u0131 bozmadan numune y\u00fczeyinin morfolojisini do\u011frudan g\u00f6zlemleyebilir ve ayn\u0131 zamanda numunenin y\u00fczey elemanlar\u0131 hakk\u0131nda kalitatif ve kantitatif bilgiler elde edebilirsiniz.<\/h6>\n\n\n\n

4. FTIR<\/h4>\n\n\n\n
\"\"<\/figure>\n\n\n\n
\u0130ngilizce ad\u0131: Fourier Transform Infrared Spectrometer
Model: Tens\u00f6r 27
\u00dcretici firma: Bruker
K\u00f6ken: Almanya<\/h6>\n\n\n\n
Teknik g\u00f6stergeler: Dalga say\u0131s\u0131 aral\u0131\u011f\u0131: 4000-400 cm-1 \u00c7\u00f6z\u00fcn\u00fcrl\u00fck: 1 cm-1; S\/N oran\u0131 32.000:1'den daha iyidir (1 dakikal\u0131k test); ROCKSOLID interferometre, m\u00fckemmel sismik performans, bak\u0131m gerektirmez; k\u0131z\u0131l\u00f6tesi mikroskop, Termal a\u011f\u0131rl\u0131k kayb\u0131, gaz kromatografisi, iki renkli titre\u015fim park\u0131 vb. ile birle\u015ftirilebilir; i\u015fletim sistemi: OPUS\/IR<\/h6>\n\n\n\n
\u0130\u015flev: Kat\u0131, gaz ve s\u0131v\u0131 numunelerin k\u0131z\u0131l\u00f6tesi spektrumlar\u0131n\u0131 ve yerinde reaksiyon s\u00fcre\u00e7lerini \u00f6l\u00e7mek i\u00e7in kullan\u0131l\u0131r, b\u00f6ylece numunedeki farkl\u0131 ba\u011f formlar\u0131 ve etkile\u015fimleri elde edilir ve buna dayanarak bile\u015fik bile\u015fim tan\u0131mlamas\u0131, bile\u015fik yap\u0131 analizi ve numunenin kimyas\u0131 ger\u00e7ekle\u015ftirilir Reaksiyon kinetik analizi.<\/h6>\n\n\n\n

5. FL<\/h4>\n\n\n\n
\"\"<\/figure>\n\n\n\n
\u0130ngilizce ad\u0131: Fluorescence Spectroscopy
Model F7000
\u00dcretici firma: Hitachi
K\u00f6ken: Japonya<\/h6>\n\n\n\n
Teknik g\u00f6stergeler: Uyarma emisyon dalga boyu aral\u0131\u011f\u0131: 200-900 nm; Hassasiyet: S\/N \uff1e 800 (RMS); S\/N \uff1e 250 (PP); Suyun Raman piki kullan\u0131l\u0131r, uyarma dalga boyu 350 nm, spektral bant geni\u015fli\u011fi 5 nm, Yan\u0131t s\u00fcresi 2 s; \u00c7\u00f6z\u00fcn\u00fcrl\u00fck: 1.0 nm Dalga boyu do\u011frulu\u011fu: 1 nm; Dalga boyu tarama h\u0131z\u0131: 30\/ 60\/ 240\/ 1200\/ 2400\/ 12000\/ 30000\/ 60000 nm\/dak<\/h6>\n\n\n\n
\u0130\u015flev: L\u00fcminesans malzemelerin floresan uyarma spektrumunu, floresan emisyon spektrumunu, \u00fc\u00e7 boyutlu spektrumunu vb. \u00f6l\u00e7\u00fcn. Ayr\u0131ca \u00fc\u00e7 boyutlu zaman tarama testi ve floresan \u00f6mr\u00fc testi de ger\u00e7ekle\u015ftirebilir.<\/h6>\n\n\n\n

\u015eimdi Bize Ula\u015f\u0131n!<\/strong><\/h4>\n\n\n\n
\u00d6zelle\u015ftirilmi\u015f hizmetleri kabul ediyoruz, genellikle 24 saat i\u00e7inde sizinle ileti\u015fime ge\u00e7ece\u011fiz. Ayr\u0131ca mesai saatleri i\u00e7inde (8:30 - 6:00 UTC+8 Pzt.~Sat.) info@longchangchemical.com adresine e-posta g\u00f6nderebilir veya h\u0131zl\u0131 yan\u0131t almak i\u00e7in web sitesi canl\u0131 sohbetini kullanabilirsiniz.<\/h6>\n\n\n\n

Bu makale Longchang Kimya Ar-Ge Departman\u0131 taraf\u0131ndan yaz\u0131lm\u0131\u015ft\u0131r. Kopyalaman\u0131z ve yeniden basman\u0131z gerekiyorsa, l\u00fctfen kayna\u011f\u0131 belirtin<\/h4>\n\n\n\n

How technical buyers usually evaluate this chemical topic<\/h2>\n

General chemical decisions usually become clearer when teams move from theory to application fit: what the material needs to do, how pure it needs to be, how it behaves in the real process, and what downstream constraints it must satisfy.<\/p>\n